Dimension Series Probe Holder Selection

The following probe holders are available for use on the Dimension Icon configured with the Dimension SPM Scanner:

Probe Holder	Model #	Description
	DAFMCH	This Contact Mode AFM & TappingMode (air) cantilever holder features piezo tip drive and tip bias connection. This holder supports Electric Force Microscopy (EFM), Magnetic Force Microscopy (MFM), and Surface Potential Detection modes as well.
	DCHNM	This Non-Magnetic Cantilever Holder supports Contact AFM and TappingMode operation in air on the Dimension Icon SPM scanner. Constructed with special material, this cantilever holder is useful for sensitive Magnetic Force Microscopy (MFM) imaging.
	DFMA	This probe holder includes a large piezo that drives the tip at a low frequency and high amplitude, permitting force imaging in air on the Dimension Icon SPM scanners. The holder can also be used in TappingMode and Contact Mode. See Force Modulation for more information.
	DSTM	The STM probe holder fits directly onto Dimension Icon SPM scanners to enable Scanning Tunneling Microscopy (STM) operation. When performing STM imaging, the sample is biased (software controllable) and the tip measures current.
	DTFML-DD-HE	The High Efficiency Direct Drive TappingMode Probe Holder is designed for Fluid Imaging in Contact mode, TappingMode, ScanAsyst, PeakForce-QNM and Electrochemistry (with appropriate accessories). Also does Force Modulation when used with Z Modulation.
	DSCMSCH	This SCM probe holder supports the Scanning Capacitance Microscopy (SCM) application module. The integrated piezo can be actuated for TappingMode operation. The holder comes with a short cable for connection to the SCM application module.
	DTRCH	The Torsional Resonance mode (TRmode) probe holder includes dual piezos to oscillate the cantilever rotationally or vertically.
	DTRCH-AM	This probe holder is designed for use with Tunneling AFM (TUNA), Conductive AFM (C-AFM), or Scanning Spreading Resistance Microscopy (SSRM) application modules, as well as for TR-TUNA.
	MPA-NP	Dimension Icon SPM scanner probe holder without tapping piezo

Probe Holder

Model #

Description

DAFMCH

This Contact Mode AFM & TappingMode (air) cantilever holder features piezo tip drive and tip bias connection. This holder supports Electric Force Microscopy (EFM), Magnetic Force Microscopy (MFM), and Surface Potential Detection modes as well.

DCHNM

This Non-Magnetic Cantilever Holder supports Contact AFM and TappingMode operation in air on the Dimension Icon SPM scanner. Constructed with special material, this cantilever holder is useful for sensitive Magnetic Force Microscopy (MFM) imaging.

DFMA

This probe holder includes a large piezo that drives the tip at a low frequency and high amplitude, permitting force imaging in air on the Dimension Icon SPM scanners. The holder can also be used in TappingMode and Contact Mode. See Force Modulation for more information.

DSTM

The STM probe holder fits directly onto Dimension Icon SPM scanners to enable Scanning Tunneling Microscopy (STM) operation. When performing STM imaging, the sample is biased (software controllable) and the tip measures current.

DTFML-DD-HE

The High Efficiency Direct Drive TappingMode Probe Holder is designed for Fluid Imaging in Contact mode, TappingMode, ScanAsyst, PeakForce-QNM and Electrochemistry (with appropriate accessories). Also does Force Modulation when used with Z Modulation.

DSCMSCH

This SCM probe holder supports the Scanning Capacitance Microscopy (SCM) application module. The integrated piezo can be actuated for TappingMode operation. The holder comes with a short cable for connection to the SCM application module.

DTRCH

The Torsional Resonance mode (TRmode) probe holder includes dual piezos to oscillate the cantilever rotationally or vertically.

DTRCH-AM

This probe holder is designed for use with Tunneling AFM (TUNA), Conductive AFM (C-AFM), or Scanning Spreading Resistance Microscopy (SSRM) application modules, as well as for TR-TUNA.

MPA-NP

Dimension Icon SPM scanner probe holder without tapping piezo

NOTE: With ongoing development, new alternatives are sometimes introduced or improvements are made to existing designs. Refer to www.brukerafmprobes.com or call Bruker for the most up-to-date information.

www.bruker.com

Bruker Corporation

www.brukerafmprobes.com

112 Robin Hill Rd.

nanoscaleworld.bruker-axs.com/nanoscaleworld/

Santa Barbara, CA 93117

Customer Support: (800) 873-9750